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UNITRON Introduces the WXS-800 Wafer Inspection Microscope for Semiconductor and Materials Inspection

UNITRON is pleased to announce the launch of the WXS-800 Wafer Inspection Microscope, a high-performance reflected-light microscope designed for reliable inspection of 8” (200mm) silicon wafers and semiconductor devices. Engineered for precision and flexibility, the WXS-800 also supports inspection of large, flat samples such as circuit boards, flat panel displays, and materials science specimens.

Purpose-Built for Wafer and Large-Sample Inspection

The WXS-800 is optimized for common semiconductor inspection and quality control applications, including wafer defect analysis, process monitoring, and failure analysis. Its spacious stage and ergonomic design allow users to efficiently handle larger samples without compromising image quality or workflow efficiency.

Multiple Contrast Techniques — Standard

To help users “see their sample in a different light,” the WXS-800 comes standard with reflected brightfield, darkfield, simple polarization, and optional Differential Interference Contrast (DIC) observation methods. These complementary techniques enable detailed surface and structural evaluation:

  • Brightfield delivers clear, high-resolution views of surface features
  • Darkfield enhances visibility of defects by highlighting scattered light from edges and imperfections
  • Polarization reveals internal stress, grain structure, and crystal defects
  • DIC improves contrast and provides a pseudo-3D appearance for visualizing subtle surface height variations

Together, these methods allow users to uncover defects and material characteristics that may be missed using a single contrast technique.

“The WXS-800 delivers the contrast, clarity, and flexibility required for modern wafer inspection, all in a system designed for consistent, dependable results,” said Brian Taub, President of UNITRON.

Clear Imaging for Documentation and Reporting

Designed to deliver sharp, high-contrast images, the WXS-800 supports digital imaging workflows commonly used in semiconductor and materials laboratories. The system enables accurate documentation, analysis, and reporting—helping users make confident, data-driven decisions.

With the introduction of the WXS-800, UNITRON continues to expand its portfolio of metallurgical and materials science microscopes, reinforcing its commitment to practical, high-quality inspection solutions for industrial, research, and educational environments.

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