UNITRON Ltd. is pleased to introduce the enVision AF, the latest autofocus digital microscope for digital inspection.
Infinite Working Distance, Continuous Zoom
The new enVision AF features an outstanding working distance that extends from 10cm to INFINITY! This allows the enVision AF to image samples of nearly any size. Adjust the microscope distance to view the entire sample, the use the 1-14X continuous optical zoom (an 1-6X digital zoom) to enlarge areas of interest for more detailed inspection.
Autofocus & Fast Live Video
The enVision AF delivers live video rates of 60fps to an HDMI-connected monitor and fast autofocus, accelerating the inspection process for greater efficiency and throughput.
Stand-Alone Operation!
The enVision AF is equipped with built-in software, allowing for inspection without the need for a PC. Simply connect the enVision AF to an HDMI-capable monitor and use the included wireless mouse to control the software, calibrate and measure, and capture images to a USB flashdrive, all without the need to clutter precious bench space with a computer.
For secure image capture, the enVision AF can be connected to a PC via Ethernet cable. Then use the free enVision PC software to control the microscope, calibrate/measure/annotate images, and save images and video to a secure local or network location.
Flexible Mounting Options
The enVision AF features a standard 76mm diameter mounting ring for mounting onto most common stereo microscope stands (e.g., pole, boom, articulating arm, etc.). IT is also equipped with 1/4"-20 and M4 tapped holes for alternative mounting options, such as copy stands. This provides extreme flexibility to mount the enVision AF in the most effective manner to accommodate your samples and inspection process.
Expanded Selection of Digital Inspection Solutions
The enVision AF expands UNITRON's portfolio of digital solutions for inspection. Learn more about our portfolio by visiting our digital inspection category page HERE.
CONTACT US directly to arrange a virtual demonstration.
