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Metallurgical & Materials Science Microscopy

METALLURGICAL & MATERIALS SCIENCE MICROSCOPES

Selecting the right metallurgical microscope starts with the samples and contrast methods your lab depends on. UNITRON offers a full range of inverted and upright metallurgical microscopes for inspecting metals, alloys, coatings, and other materials science and electronic samples — from the entry-level MEC4 to the advanced, recently introduced PrisMET and proven EXAMET-5 and Versamet 4 platforms, plus the new WXS-800 for wafer and semiconductor inspection. Each model supports brightfield observation as standard, with darkfield, polarization, and DIC (differential interference contrast) available depending on the platform, so you can match contrast capability to the level of detail your samples require. Pair any model with UNITRON's newly updated METRICAL™ v7.0.7 software — now bundled with a high-performance digital microscope camera — to turn observation into quantitative, standards-compliant analysis.

MEC4 metallurgical microscope MEC4
Our entry level inverted metallurgical microscope features Plan Achromat objectives, a trinocular viewing head, and a rear carry handle for improved transportability. The optional attachable mechanical stage adds flexibility for sample positioning.
Versamet 4 metallurgical microscope Versamet 4
The Versamet 4 is an excellent choice for the serious metallurgist. Available with brightfield and darkfield observation methods, the Versamet 4 delivers exceptional clarity and performance in an inverted metallurgical microscope. The standard trinocular viewing head is ready to accept a digital camera for analysis and documentation. Optional simple polarization and DIC (differential interference contrast) add contrast methods for advanced analysis.
PrisMET microscope for metallurgical and materials analysis NEW!  PrisMET
The PrisMET is UNITRON's advanced upright microscope for metallurgical and materials science applications, with expanded contrast capabilities. In addition to reflected brightfield illumination, the PrisMET adds darkfield and oblique illumination to reveal surface topology and micro-features that conventional brightfield can miss, while optional reflected and transmitted polarization support analysis of crystalline structures and stress patterns. Optional reflected-light DIC further enhances the visibility of subtle surface variations and grain boundaries. Energy-efficient LED illumination and long working distance optics round out the platform, and the standard trinocular viewing head is ready to accept a digital camera for documentation and image analysis with UNITRON's METRICAL software.

EXAMET-5 Advanced Upright Compound Metallurgical Microscope EXAMET-5
The EXAMET-5 is UNITRON's advanced upright microscope for metallurgical and materials science applications.  The EXAMET-5 features reflected light with a powerful 5W LED, combination reflected and transmitted light, and long working distance Plan Achromat objectives.  Polarizers/analyzers and color filters are available for analytical methods.  The standard trinocular viewing head is ready to accept a digital camera (via camera adapter) for documentation and image analysis.
Materials Metallurgical Software METRICAL SOFTWARE for METALLURGICAL & MATERIALS ANALYSIS
New METRICAL v7.0 Software from UNITRON is a comprehensive and quantitative solution for metallographic studies.  The available software modules conform to all equivalent national and international standards.  New analysis modules include Dendrites and Hardness (Brinell and Vickers).  Other analysis modules include Segmentation, Lamellar Graphite, Porosity, Coating Thickness, Spheroidization, Spheroidal Graphite, Grain Size, Decarburization, and Non-Metallic Inclusion.  To ensure optimal performance, METRICAL (CAT# 14625-USB) now includes a high-performance, 5MP, USB 3.0 digital microscope camera.
WXS-800 Semiconductor & Wafer Inspection Microscope NEW WXS-800
The NEW WXS-800 wafer inspection microscope delivers fast, reliable, and non-destructive inspection for 8” (200mm) wafers, circuit boards, flat panel displays, and other large samples. Optimized for semiconductor manufacturing and electronics applications, it combines multiple observation methods — brightfield, darkfield, and polarized light (optional DIC) — to reveal a wide range of defects and material features. Offering speed, ease of use, and cost efficiency compared to more advanced techniques, the WXS-800 is a versatile solution for precision inspection.

Metallurgical & Materials Science Microscopy

8 Item(s)

8 Item(s)