Building on the proven EXAMET-5 platform, PrisMET expands standard contrast capabilities to include reflected darkfield and oblique illumination alongside brightfield, helping users visualize surface topology and micro-features that are often difficult to detect with conventional microscopy. Reflected and transmitted polarization is available as an option for examining crystalline structures and stress patterns, and for labs requiring even greater contrast, optional reflected-light Differential Interference Contrast (DIC) enhances the visibility of subtle surface variations and grain boundaries.

PrisMET is available in two trinocular configurations: a standard fixed-split trinocular head, and a configuration featuring a 3-position light path selector (100/0, 80/20, 0/100 to eyepieces/trinocular port) for added flexibility between visual observation and camera documentation. Both configurations feature Semi-Apochromatic Brightfield/Darkfield Infinity optics, energy-efficient 3W LED illumination, and full digital capability.

"PrisMET gives materials scientists and metallurgists the illumination flexibility to see the details that matter most, without unnecessary complexity," said Mark Clymer, Vice President of Products at UNITRON. "Paired with our METRICAL image analysis software, it's a complete platform for standards-compliant metallurgical and materials analysis." UNITRON's METRICAL™ image analysis software includes over 14 specialized measurement tools — including grain size, porosity, and hardness evaluation — for accelerated, reproducible sample analysis.

For more information on the new UNITRON PrisMET, please visit https://microscopes.unitronusa.com/unitron-microscopes/metallurgical-microscopes/prismet.html.

About UNITRON UNITRON specializes in high quality, precision instruments for industrial, clinical, life science, research and educational applications. Since 1952, UNITRON's microscopes and related optical accessories have been consistently used and trusted worldwide in companies such as Intel, BAE Systems, ITT, GE, DuPont, Boeing, 3M, MIT, Raytheon, Sony, Texas Instruments, Northrop Grumman, and the Mayo Clinic. Manufactured and assembled to the strictest quality standards, our products are available exclusively through a nationwide network of authorized distributors. Visit us at https://microscopes.unitronusa.com/.

The Z750 features a 7.5:1 zoom ratio with a magnification range of 6.7x–50x (with 10x eyepieces) and apochromatically corrected optics that deliver exceptional image clarity and color accuracy across the full zoom range. A long working distance of 125mm provides ample room for tools and sample manipulation, making the Z750 an excellent choice for industrial inspection, assembly, quality control, medical device manufacturing, OEM integration, research and education applications.

The Z750 is a versatile, high performance, ergonomically designed zoom stereo microscope ruggedly built to withstand years of heavy usage. It is available with either a binocular or trinocular viewing head, and can be configured on all standard UNITRON stereo microscope stands.

For more information on the Z750, please visit https://microscopes.unitronusa.com/unitron-microscopes/unitron-stereo-microscopes/series/z750.html or contact UNITRON at info@unitronusa.com / 631-543-2000.

METRICAL's computer-aided quantitative analysis strictly follows ISO and ASTM technical standards, with dedicated modules for Grain Size, Porosity, Segmentation, Decarburization, SG Iron/Nodularity, Gray Iron, Carbide Banding, Spheroidization, Inclusion, Dendrites, Hardness (Brinell and Vickers), and Coating Thickness — plus automatic modes for Gray Iron and Grain analysis.

"METRICAL was built to take the guesswork and operator variability out of metallurgical sample analysis," said Mark Clymer, Vice President of Product. "With version 7.0.7, we're pairing that analytical power with a camera purpose-selected for the job, so labs get consistent, high-resolution imaging right out of the box."

What's New in v7.0.7

The headline feature is the inclusion of a high-performance 5MP, USB 3.0 microscope camera with every METRICAL software purchase. Key specifications include:

• 5MP (2448 x 2048) Sony IMX264 color sensor
• 2/3" sensor optical format (requires 0.65x or higher C-mount camera adapter, not included)
• Large 3.45 µm pixels for improved light sensitivity and image clarity
• Global shutter for distortion-free image capture
• High sensitivity rating of 1146 mV
• High-speed USB 3.0 Type-A to Type-B gold-plated cable (2.0 m) included

Because METRICAL is calibrated and validated specifically for this camera, customers can expect consistent, repeatable image capture supporting the accuracy of every analysis module. METRICAL does not support third-party cameras, ensuring every measurement comes from a known, qualified imaging pipeline. Older versions of METRICAL (v6.4 and lower) cannot be upgraded to METRICAL v7.0.7.

Continued Strength Across the Analysis Suite

Version 7.0.7 carries forward METRICAL's full analytical breadth, allowing labs to standardize on one platform across sample types:

• Cast iron laboratories use the Gray Iron and SG Iron/Nodularity modules, including automatic Gray Iron classification.
• Heat treatment and steel laboratories rely on Grain Size, Carbide Banding, Spheroidization, and Decarburization to verify microstructure and process control.
• Coatings labs use Coating Thickness to quantify layer thickness and uniformity.
• Foundries and quality labs use Porosity and Inclusion modules to characterize internal defects per ASTM standards.
• Casting, welding, and additive manufacturing applications are supported by Dendrites and Segmentation modules.
• Hardness testing is supported through Brinell and Vickers modules.

METRICAL also includes tools for measurement, calibration, gallery management, filters and annotations, and a built-in report database for generating ISO- and ASTM-compliant documentation.

Producing More From Every Image

UNITRON notes that METRICAL's image processing techniques extract more usable data from every capture, producing as much as 80% more picture points in the image window than comparable software, improving both measurement accuracy and workflow efficiency.

Availability

METRICAL v7.0.7, including the bundled 5MP USB 3.0 camera and stage micrometer, is available now through UNITRON and its authorized distributors. The software is compatible with any brand of microscope, though UNITRON's Versamet 4, EXAMET-5, MEC4 and new PrisMET metallurgical microscopes are recommended for optimal performance. Free demonstrations are available to qualified laboratories by contacting info@unitronusa.com or 631-543-2000.

About UNITRON

UNITRON Ltd. has designed and manufactured microscopes and imaging systems for industrial, metallurgical, materials science, research, and educational applications since 1952. The company is headquartered at 73 Mall Drive, Commack, NY 11725.

Unitron’s microscopy solutions are designed with this reality in mind. From stereo microscopes used daily on assembly lines to metallurgical microscopes supporting materials analysis, Unitron systems help technicians, engineers, and researchers visualize critical details that directly affect performance, reliability, and yield.

Seeing What Matters—From Microns to Measurable Results

Modern optical microscopes provide resolution approaching 200 nanometers, revealing surface features, microstructures, defects, and interfaces that are invisible to the naked eye. In industrial applications, this level of detail is often exactly what’s required—without the complexity, cost, or sample preparation associated with more specialized imaging techniques.

Unitron’s high-resolution optical microscopes support a wide range of inspection, quality control, and research tasks, delivering consistent, repeatable results in environments where accuracy and uptime matter.

Stereo Microscopes: 3D Visualization for Inspection, Assembly, and Rework

Stereo microscopes are among the most widely used tools in industrial microscopy—and for good reason. By providing a true three-dimensional view of the sample, stereo microscopes allow users to work comfortably and precisely while maintaining excellent depth perception.

This 3D perspective is especially valuable in applications that require hand–eye coordination, including:

• Electronics inspection and rework
• PCB assembly and solder joint evaluation
• Precision mechanical assembly
• Failure analysis and component verification

In electronics manufacturing, for example, stereo microscopes enable technicians to inspect fine-pitch components, identify solder defects, and perform rework with confidence. The combination of magnification, working distance, and depth of field makes stereo microscopes ideal for tasks where users must interact directly with the sample—not just observe it.

As Unitron’s top-selling product category, stereo microscopes play a critical role in production environments where speed, ergonomics, and reliability are essential.

Understanding Material Behavior Through Optical Microscopy

In materials science and metallurgy, microstructure influences nearly every aspect of material performance. Optical microscopy provides a practical and effective way to evaluate these structures during development, processing, and failure analysis.

High-resolution metallurgical microscopes are commonly used to:

• Examine etched metal samples for grain size and phase distribution
• Identify cracks, inclusions, porosity, and surface defects
• Verify heat treatment processes and material consistency

Unitron’s metallurgical and materials science microscopes support routine analysis of metals, alloys, ceramics, and engineered materials, helping users connect microstructural features to real-world performance.

Supporting Material Development and Process Optimization

Throughout the material lifecycle—from R&D to production—optical microscopy enables fast, actionable insight.

Examples include:

• Metals and Alloys: Evaluating microstructural changes caused by machining, forging, casting, or heat treatment
• Coatings and Surface Treatments: Measuring coating thickness, uniformity, adhesion, and wear patterns using reflected-light microscopy

These observations help engineers refine processes, improve consistency, and reduce scrap or rework. Because optical microscopy is fast and repeatable, it remains a cornerstone of quality assurance and continuous improvement programs.

Evaluating Composite and Engineered Materials

Composite materials depend on precise interactions between fibers, matrices, and layers. Optical microscopy allows users to assess:

• Fiber distribution and alignment
• Matrix integrity and voids
• Layer interfaces and early signs of delamination

High-resolution imaging supports both incoming material inspection and ongoing process validation, helping manufacturers optimize strength, durability, and long-term performance.

Digital Imaging and Measurement for Modern Workflows

Pairing optical microscopes with digital cameras and analysis software enhances both documentation and decision-making. Unitron’s digital imaging solutions enable users to:

• Capture high-quality images for reports and audits
• Perform calibrated measurements and annotations
• Compare samples over time or across production runs

These capabilities are especially valuable in industrial and research environments where traceability, repeatability, and clear communication are essential.

A Practical Foundation for Industrial Microscopy

High-resolution optical microscopy continues to be a foundational tool in industrial inspection, materials science, and applied research. Its strength lies in delivering meaningful information quickly and efficiently—whether through the 3D visualization of a stereo microscope or the detailed surface analysis of a metallurgical system.

Unitron’s commitment to optical microscopy ensures that users have access to durable, precise, and easy-to-use solutions that support real-world workflows. From electronics manufacturing and quality control to materials research and education, these tools help users see clearly, work confidently, and make informed decisions.

Move Forward with Confidence

If your work depends on accurate visualization, precise manipulation, or reliable inspection, high-resolution optical microscopy remains an essential investment. Explore Unitron’s stereo, metallurgical, and digital microscopy solutions to support inspection, assembly, quality assurance, and materials research with clarity and confidence.

The Hidden Clues of Comparative Microscopy

In forensic investigations, even the smallest details can untangle complex questions of cause and responsibility. Minute surface marks—often invisible to the naked eye—can carry critical information about how a crime was committed and what tools were involved. Without the right analytical approach, these clues risk being overlooked or misunderstood.

Comparative microscopy changes that equation. By enabling direct, side-by-side examination of physical evidence, this technique allows forensic scientists to identify similarities and differences with clarity and confidence. What once appeared insignificant can become a defining piece of the investigative puzzle, helping examiners connect evidence to specific actions, tools, or firearms. In modern forensic science, this capability is not just helpful—it’s essential.

Understanding Comparative Microscopy

Comparative microscopy is a forensic technique that allows two or more specimens to be examined simultaneously under matched optical conditions. Unlike traditional microscopy, which focuses on a single sample at a time, comparative microscopy emphasizes direct visual comparison, making it easier to identify corresponding features or meaningful differences.

This approach relies on specialized instruments designed for precision and stability. Forensic comparison microscopes use a dual optical path to present specimens side by side within a single field of view. High-quality optics, consistent illumination, and digital imaging capabilities allow forensic examiners to evaluate microscopic details with accuracy and repeatability—critical requirements in firearm and toolmark examination.

Applications in Forensic Science

Comparative microscopy plays a central role in several areas of forensic evidence analysis, including:

• Paint Analysis: Comparing paint layers and surface characteristics to determine a common source.
• Gunshot Residue: Evaluating particulate evidence associated with firearm discharge.
• Toolmark Examination: Analyzing marks left when a tool or firearm component comes into contact with another surface.
• Firearm and Ballistic Evidence: Comparing bullets and cartridge cases to assess whether they were fired from the same weapon.

Toolmark Examination in Practice

In a hypothetical firearms investigation, forensic examiners use a forensic comparison microscope to analyze toolmarks on a spent cartridge case recovered from a crime scene. By comparing breech face impressions, firing pin marks, and other cartridge case features to test-fired samples from a suspect firearm, examiners can assess microscopic similarities created during the firing process.

This side-by-side analysis allows investigators to determine whether the marks share a common origin, helping establish a reliable association between the evidence and a specific firearm. Such comparisons are a cornerstone of firearm and toolmark examination and demonstrate the critical role comparative microscopy plays in linking physical evidence to real-world events.

Advantages Over Traditional Methods

Comparative microscopy offers several advantages over traditional, single-sample examination techniques:

1. Direct visual comparison: Viewing evidence simultaneously reduces interpretation gaps and supports objective analysis.
2. High-resolution imaging: Advanced optics and digital documentation capture minute details for review and reporting.
3. Improved reliability: Consistent viewing conditions strengthen examiner confidence and support defensible conclusions.

By minimizing subjectivity and enhancing clarity, comparative microscopy improves the overall quality of forensic evidence analysis—particularly in cases involving ballistic and toolmark evidence.

Challenges and Practical Considerations

Like any advanced forensic technique, comparative microscopy requires specialized training and experience. Examiners must understand how toolmarks are created, how to prepare and orient samples, and how to interpret similarities responsibly.

Cost can also be a consideration for some laboratories, as forensic comparison microscopes are precision instruments. However, reliable equipment, technical support, and application-specific design help forensic professionals maximize the value of these systems in daily casework.

The Future of Comparative Microscopy in Forensics

As forensic laboratories continue to modernize, comparative microscopy remains a foundational technique. Ongoing advancements in digital imaging, documentation software, and workflow integration are enhancing how evidence is captured, reviewed, and presented.

Emerging technologies—such as AI-assisted pattern recognition and improved digital comparison tools—are expected to support examiners without replacing expert judgment. As these developments evolve, comparative microscopy will continue to play a vital role in firearm and toolmark examination, supporting accurate, transparent, and reproducible forensic analysis.

The Future of Forensic Precision

In the complex world of forensic science, comparative microscopy stands out as a powerful tool for uncovering truth at the microscopic level. By enabling detailed, side-by-side comparison of ballistic and toolmark evidence, it helps forensic professionals transform subtle markings into meaningful conclusions.

As investigative demands increase and standards for accuracy rise, comparative microscopy remains essential to modern forensic practice. When justice depends on the smallest details, having the right tools—and the ability to interpret them with confidence—makes all the difference.

Ballistics is often described as the study of a bullet’s journey, but for forensic investigators and firearm examiners, the most critical work begins at the moment a trigger is pulled. Understanding where and how ballistic evidence is generated—and which phases preserve examinable detail—is essential to accurate firearm identification and courtroom-ready conclusions.

The Three Phases of Forensic Ballistics—Revisited

Forensic ballistics analysis is traditionally divided into three phases: internal ballistics, external ballistics, and terminal ballistics. While each phase contributes to reconstructing a shooting incident, not all phases generate physical evidence suitable for microscopic examination.

Internal Ballistics: Where Firearm and Toolmark Evidence Is Created

Internal ballistics examines what happens inside the firearm from ignition until the projectile exits the barrel. This brief but intense phase is where the most critical firearm and toolmark evidence is formed.

As the cartridge is fired, interaction between the firearm and ammunition produces distinctive toolmarks, including firing pin impressions, breech face marks, chamber markings, extractor and ejector marks, and barrel striations. These features serve as mechanical signatures shaped by manufacturing processes, wear, and use—often unique to a specific firearm.

Forensic scientists rely on comparison forensic microscopes to analyze this evidence during firearm and toolmark examination. By viewing two specimens simultaneously under matched optical conditions, examiners can evaluate microscopic similarities and differences with clarity and confidence. Unitron’s forensic comparison microscopes are engineered specifically for ballistic, firearm, and toolmark analysis, supporting precise side-by-side comparisons that are central to reliable identification and expert testimony.

Stereo microscopes also play a critical role in internal ballistics analysis. Their three-dimensional visualization and wide field of view make them ideal for initial evidence screening, orientation, and examination of surface topography before detailed microscopic comparison begins.

External Ballistics: Trajectory Analysis and Scene Reconstruction

Once a bullet exits the firearm, it enters the realm of external ballistics. This phase focuses on the projectile’s movement through the air, influenced by gravity, distance, and environmental conditions. External ballistics supports trajectory reconstruction and crime scene analysis, helping investigators determine shooter position and bullet path.

Because external ballistics does not involve sustained contact with solid surfaces, it produces little physical evidence for laboratory microscopy. As a result, this phase relies more on measurements, calculations, and modeling than on microscopic comparison.

Terminal Ballistics: Microscopic Examination After Impact

Terminal ballistics begins when a bullet strikes its target. While impact can deform or fragment a projectile, it may also preserve portions of the striations and surface features imparted during internal ballistics.

Recovered bullets and fragments are frequently examined using stereo microscopes and digital microscopes to assess deformation patterns, material transfer, and remaining toolmarks. Digital microscope systems—such as Unitron’s microFOCUS 4K and enVision AF—support high-resolution imaging, measurement, and documentation, allowing forensic scientists to capture detailed visual records and share findings efficiently. In some cases, sufficient identifying detail remains to support further comparison, extending ballistic evidence analysis into this final phase.

Microscopes Used in Forensic Ballistics and Firearm Examination

Modern firearm and toolmark examination depends on selecting the right microscope for each analytical task. Comparison forensic microscopes form the foundation of ballistic identification, enabling precise, simultaneous comparisons of bullets and cartridge cases. Stereo microscopes provide essential three-dimensional context for evidence handling and surface evaluation, while digital microscopes enhance documentation, measurement, and presentation with ergonomic and workflow advantages.

Together, these microscopy solutions support accurate forensic ballistics analysis, from initial evidence screening through final courtroom presentation.

Precision Today, Confidence Tomorrow

As forensic science continues to evolve, new technologies enhance ballistic investigations, but the fundamentals remain unchanged: identifying marks created through mechanical interaction and examining them with clarity and consistency. Advances such as artificial intelligence and digital workflows build upon the same microscopic evidence formed during internal and terminal ballistics.

In forensic ballistics, truth is often measured in microns. By focusing on the phases where ballistic evidence is physically created and preserved—and by using purpose-built tools like Unitron’s comparison, stereo, and digital microscopes—investigators can transform minute details into decisive answers. Precision instruments and careful analysis don’t just support investigations—they strengthen the pursuit of justice, one comparison at a time.

Purpose-Built for Wafer and Large-Sample Inspection

The WXS-800 is optimized for common semiconductor inspection and quality control applications, including wafer defect analysis, process monitoring, and failure analysis. Its spacious stage and ergonomic design allow users to efficiently handle larger samples without compromising image quality or workflow efficiency.

Multiple Contrast Techniques — Standard

To help users “see their sample in a different light,” the WXS-800 comes standard with reflected brightfield, darkfield, simple polarization, and optional Differential Interference Contrast (DIC) observation methods. These complementary techniques enable detailed surface and structural evaluation:

• Brightfield delivers clear, high-resolution views of surface features
• Darkfield enhances visibility of defects by highlighting scattered light from edges and imperfections
• Polarization reveals internal stress, grain structure, and crystal defects
• DIC improves contrast and provides a pseudo-3D appearance for visualizing subtle surface height variations

Together, these methods allow users to uncover defects and material characteristics that may be missed using a single contrast technique.

“The WXS-800 delivers the contrast, clarity, and flexibility required for modern wafer inspection, all in a system designed for consistent, dependable results,” said Brian Taub, President of UNITRON.

Clear Imaging for Documentation and Reporting

Designed to deliver sharp, high-contrast images, the WXS-800 supports digital imaging workflows commonly used in semiconductor and materials laboratories. The system enables accurate documentation, analysis, and reporting—helping users make confident, data-driven decisions.

With the introduction of the WXS-800, UNITRON continues to expand its portfolio of metallurgical and materials science microscopes, reinforcing its commitment to practical, high-quality inspection solutions for industrial, research, and educational environments.

A dual-color ring light, specifically white light and UV-A light (CAT# 15859-B), offers significant advantages over white-only illuminators, specifically for inspection where conformal coatings are used to protect sensitive electrical components.

Learn more about our assortment of ring lights at https://microscopes.unitronusa.com/unitron-microscopes/parts-accessories/illumination.html or https://microscopes.unitronusa.com/lx-microscopes-by-unitron/parts-accessories/illumination.html.

New Easy to Use Interface

The new user interface of METRICAL v7.0 (CAT# 14625) puts all analysis and settings modules at your fingertips, eliminating the need to exit from one module to use another module to analyze the same sample by a different method.

Process-Driven Image Analysis

Each analysis module guides you through logic steps to take you from image acquisition, processing the image, and performing the analysis.

Expanded Capability with New Analysis Modules

New to v7.0 are analysis modules for Dendrites and Hardness (Brinell and Vickers), plus automatic and semi-automatic image processing and analysis for Gray Iron and Grains.

About METRICAL

• METRICAL provides computer-aided quantitative analysis results that strictly follow ISO & ASTM technical standards.
• The software is powerful to handle different image format BMP, TIFF, GIF, JPEG etc.
• METRICAL supports several cameras, USB 2.0 & USB 3.0 devices, and TWAIN input devices. Ask us for a recommendation based on your application.
• This exceptional software produces as much as 80% more picture points in image window than competitive software.
• The image processing technique streamlines image capture, measurement and enhancement, while improving the accuracy of your results.
• NEW Live measurement saves time.

Learn more by visiting the METRICAL webpage: https://microscopes.unitronusa.com/catalog/product/view/id/711/s/metrical-software/

Brand new is the enVision AF autofocus digital microscope featuring an infinite working distance (10cm to infinity), high depth of field, 1x-16x optical zoom, live HD video streaming at an incredible 60fps, and built-in software for true stand-alone operation.  The enVision AF is equipped with ¼”-20 and M4 mounting holes and a 76mm diameter ring for mounting onto most standard stereo microscope stands.

The microFOCUS 4K autofocus digital inspection microscope features built-in software for operation without the need for a PC, and includes robust features for image capture and processing, calibration, measurement, and illumination control of the included LED ring light. The microFOCUS 4K boasts a 1x-18x optical zoom with a 250mm working distance to accommodate a variety of sample sizes.  View live 4K video streaming at 30fps without image lag.

We will also be demonstrating the Inspex 3 digital microscope, our ESD-safe ergonomic TRU-trinocular stereo zoom microscope with camera and monitor, our new 10x-65x TRU-trinocular stereo zoom microscope with camera and monitor, plus an assortment of LED ring lights to solve your most challenging illumination requirements.

LX Microscopes by UNITRON microscopes and accessories are designed and manufactured for the rigors of production and inspection environments.  With a wide range of stereo zoom microscopes, LED ring lights and digital inspection solutions, LX Microscopes by UNITRON provides outstanding products to meet your inspection, assembly, rework and quality control requirements.  Contact us for more information.